Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

Year	2013
Authors	Héctor Esteban González Vicente E. Boria Esbert
Co-authors	Belenguer, A#@#Elena Díaz Caballero
Journal	Electronics Letters
Volume	49
Number	2
Pages	132 -133
Dates	17
DOI	http://dx.doi.org/10.1049/el.2012.3027
Research Groups	Microwave Applications Group (GAM)